Paper
11 June 2007 Noise in superconducting MgB2 thin film
B. Lakew, S. Aslam, H. Jones
Author Affiliations +
Proceedings Volume 6600, Noise and Fluctuations in Circuits, Devices, and Materials; 660022 (2007) https://doi.org/10.1117/12.724658
Event: SPIE Fourth International Symposium on Fluctuations and Noise, 2007, Florence, Italy
Abstract
Noise was studied in an MgB2 thin film grown on a SiN substrate, with a superconducting transition temperature, Tc, near 39K. At the mid-point of the transition and at 10Hz a noise spectral density Sv = 0.34nVHz1/2 was measured. The temperature noise, Kn , of the MgB2 film at different frequencies is compared to that of cuprate high temperature superconducting (HTS) thin films (with Tc ~ 90 K) used currently in transition-edge devices. Kn values predict that 2-D arrays of high performance infrared devices can be developed using MgB2.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
B. Lakew, S. Aslam, and H. Jones "Noise in superconducting MgB2 thin film", Proc. SPIE 6600, Noise and Fluctuations in Circuits, Devices, and Materials, 660022 (11 June 2007); https://doi.org/10.1117/12.724658
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KEYWORDS
Thin films

Superconductors

Silicon

Bolometers

Resistance

Temperature metrology

Thin film growth

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