Non-contact and on-line cone diameter measuring based on high speed linear CCD

Guohui Zhou; Jianhua Wang

doi:10.1117/12.678611

23 February 2006 Non-contact and on-line cone diameter measuring based on high speed linear CCD

Guohui Zhou, Jianhua Wang

Proceedings Volume 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 61503D (2006) https://doi.org/10.1117/12.678611
Event: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2005, Xian, China

Abstract

The remarkable improvement of sensing and processing hardware performance makes the non-contact, on-line, high accuracy and high speed measuring possible by means of linear CCD. The goal of this paper is to describe the key questions on designing the cone diameter detecting system by linear CCD. This paper first describes the detecting scheme. In particular, the factors affecting accuracy, such as resolution, voltage difference between neighbor pixels, detecting rate and so on, are analyzed, and the quantitative estimation equations are provided. CCD takes on the photoelectric translation and measuring component double functions, so the waveform of CCD output signal and the affecting factors merit deep discussion. On the basis of discussion, several principles that can be used to improve the boundary recognition accuracy are presented.

Citation Download Citation

Guohui Zhou and Jianhua Wang "Non-contact and on-line cone diameter measuring based on high speed linear CCD", Proc. SPIE 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 61503D (23 February 2006); https://doi.org/10.1117/12.678611

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KEYWORDS

Charge-coupled devices

Digital signal processing

Signal processing

Signal to noise ratio

Optical systems

Optical resolution

Video processing

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