Ronchi test with sub-structured gratings

Yaoltzin Luna-Zayas; Fermín-Granados Agustín; Alejandro Cornejo-Rodríguez

doi:10.1117/12.668170

1 February 2006 Ronchi test with sub-structured gratings

Yaoltzin Luna-Zayas, Fermín-Granados Agustín, Alejandro Cornejo-Rodríguez

Author Affiliations +

Proceedings Volume 6034, ICO20: Optical Design and Fabrication; 60341W (2006) https://doi.org/10.1117/12.668170
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China

Abstract

The Ronchi test is a well-known method for the testing of optical components and systems, and can be studied by ray tracing and lateral shearing interferometry. In this paper, the Ronchi test is applied using an LCD, for generating gratings with different periods for the dark and light zones, in order to obtain sharpening of the fringes. Experimental and computer simulations will be presented for parabolic surfaces.

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Yaoltzin Luna-Zayas, Fermín-Granados Agustín, and Alejandro Cornejo-Rodríguez "Ronchi test with sub-structured gratings", Proc. SPIE 6034, ICO20: Optical Design and Fabrication, 60341W (1 February 2006); https://doi.org/10.1117/12.668170

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