Paper
7 December 2006 Channeling X-rays at the ELBE radiation source
W. Wagner, B. Azadegan, A. Panteleeva, J. Pawelke, W. Enghardt
Author Affiliations +
Proceedings Volume 5974, International Conference on Charged and Neutral Particles Channeling Phenomena; 59740B (2006) https://doi.org/10.1117/12.639982
Event: International Conference on Charged and Neutral Particles Channeling Phenomena, 2004, Rome, Italy
Abstract
A new setup for the measurement of electron channeling radiation has been taken into operation at the ELBE radiation source. First experiments at electron energies of 14.6 and 17 MeV using diamond type-IIa crystals were aimed at the verification of the dependence of the yield of channeling radiation on the crystal thickness. While the dissipative approach assuming an exponentially decreasing occupation function with an energy-dependent characteristic occupation length (locc) is able to describe the yield up to a thickness of about 2locc multiple scattering remarkable influences the yield at larger crystal thickness.
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Wagner, B. Azadegan, A. Panteleeva, J. Pawelke, and W. Enghardt "Channeling X-rays at the ELBE radiation source", Proc. SPIE 5974, International Conference on Charged and Neutral Particles Channeling Phenomena, 59740B (7 December 2006); https://doi.org/10.1117/12.639982
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Cited by 2 scholarly publications.
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KEYWORDS
Crystals

Chromium

Diamond

Laser crystals

Multiple scattering

Electron beams

X-rays

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