Machine vision method for small feature measurements

Kevin G. Harding; Shu-Guo Gordon Tang

doi:10.1117/12.577949

16 December 2004 Machine vision method for small feature measurements

Proceedings Volume 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II; (2004) https://doi.org/10.1117/12.577949
Event: Optics East, 2004, Philadelphia, Pennsylvania, United States

Abstract

Small features such as bevels and edge profiles are a common and often critical feature on many manufactured parts. In the past, the only ways to measure such features was to make a wax mold of the feature and slice it for measurement on an optical comparator, or to do a slow mechanical tracing with a stylus or CMM type measurement system. This paper describes the application of machine vision tools, using controlled lighting to highlight shape information such as curvature, combined with 2D vision processing to extract the 3D shape based upon surface modeling.

Citation Download Citation

Kevin G. Harding and Shu-Guo Gordon Tang "Machine vision method for small feature measurements", Proc. SPIE 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II, (16 December 2004); https://doi.org/10.1117/12.577949

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