Paper
7 December 2004 Intracavity Raman spectroscopy for industrial stack gas analysis
Troy W. Francisco, Ronald R. Rich
Author Affiliations +
Abstract
A multi-gas analyzer based on intracavity Raman scattering has been evaluated and its performance compared with traditional industrial emission monitoring techniques. In this setup, the analyzer has the ability to monitor pollutants, such as SO2, as well as CO, CO2, N2 and O2. Since this is one of the first and most recent attempts to utilize this technology in the chemical industry, this work focuses on typical performance parameters and how well this analyzer fits a typical industrial application. The basic theory of operation, sampling system considerations and results of the calibration effort are presented. Limitations of the technology are also outlined in an effort to show where this analyzer competes with traditional process measurement systems. When applicable, this technique could replace multiple analyzer systems and their associated sampling systems, leading to improved analyzer reliability and maintainability.
© (2004) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Troy W. Francisco and Ronald R. Rich "Intracavity Raman spectroscopy for industrial stack gas analysis", Proc. SPIE 5586, Advanced Environmental, Chemical, and Biological Sensing Technologies II, (7 December 2004); https://doi.org/10.1117/12.580121
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Cited by 1 scholarly publication.
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KEYWORDS
Raman spectroscopy

Raman scattering

Statistical analysis

Calibration

Optical filters

Chemical analysis

FT-IR spectroscopy

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