Long term stability estimation of DC electrical sources from low frequency noise measurements

Carmine Ciofi; Gino Giusi; Calogero Pace

doi:10.1117/12.547137

25 May 2004 Long term stability estimation of DC electrical sources from low frequency noise measurements

Carmine Ciofi, Gino Giusi, Calogero Pace

Proceedings Volume 5470, Noise in Devices and Circuits II; (2004) https://doi.org/10.1117/12.547137
Event: Second International Symposium on Fluctuations and Noise, 2004, Maspalomas, Gran Canaria Island, Spain

Abstract

An indirect approach for estimating the long term stability of DC electrical sources from low frequency noise measurements is presented and discussed. In particular, it is demonstrated that once the unity frequency magnitude and the frequency exponent of the flicker noise component are determined, an overestimate of the variance of repeated measurements of the source output (averaged over a time interval τ) taken ΔT seconds apart can be readily obtained. The proposed approach is validated with reference to actual experimental data.

Citation Download Citation

Carmine Ciofi, Gino Giusi, and Calogero Pace "Long term stability estimation of DC electrical sources from low frequency noise measurements", Proc. SPIE 5470, Noise in Devices and Circuits II, (25 May 2004); https://doi.org/10.1117/12.547137

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