Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses

Sergey V. Chekalin; V. O. Kompanets; Vladilen S. Letokhov; Yu A. Matveets; B. N. Mironov; S. K. Sekatskii

doi:10.1117/12.558810

20 April 2004 Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses

Sergey V. Chekalin, V. O. Kompanets, Vladilen S. Letokhov, Yu A. Matveets, B. N. Mironov, S. K. Sekatskii

Author Affiliations +

Proceedings Volume 5402, International Workshop on Quantum Optics 2003; (2004) https://doi.org/10.1117/12.558810
Event: International Workshop on Quantum Optics 2003, 2003, St. Petersburg, Russian Federation

Abstract

It is shown that the high-resolution laser photoelectron microscope with subwavelength-spatial resolution can be used for an absolute values of the two-photon external photoelectric effect measurements with high (a few nm-scale) localization. The spatial distribution of light intensity in the near field is studied by observing the photoelectron projection images of a subwavelength nanoaperture. The imaging electrons are obtained as a result of two-photon external photoelectric effect induced in the aperture formed at the end of an optical fiber by femtosecond pulses of the second-harmonic radiation (410 nm) of a Ti:sapphire laser. The light-field distribution in the aperture is not distorted by any near-by object, which allows the first nonperturbing measurement of such a distribution.

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Sergey V. Chekalin, V. O. Kompanets, Vladilen S. Letokhov, Yu A. Matveets, B. N. Mironov, and S. K. Sekatskii "Recording of optical near-field in laser photoelectron microscope by means of two-photon ionization by femtosecond laser pulses", Proc. SPIE 5402, International Workshop on Quantum Optics 2003, (20 April 2004); https://doi.org/10.1117/12.558810

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