Modeling the effects of proton damage to CCDs on astrometric measurement precision

Bryan N. Dorland

doi:10.1117/12.508590

12 January 2004 Modeling the effects of proton damage to CCDs on astrometric measurement precision

Bryan N. Dorland

Author Affiliations +

Proceedings Volume 5167, Focal Plane Arrays for Space Telescopes; (2004) https://doi.org/10.1117/12.508590
Event: Optical Science and Technology, SPIE's 48th Annual Meeting, 2003, San Diego, California, United States

Abstract

High accuracy space astrometry missions such as the recently proposed AMEX will observe tens of millions of stars with mission measurement accuracies of less than 150 microarcseconds at m_v = 9. In order to achieve this level of accuracy and coverage, focal planes containing tens of CCDs are necessary. These CCDs are exposed to damage from charged particles from Earth's radiation belts and solar wind. We have developed a computer simulation in order to estimate the effects of charged particle damage on the single measurement precision of an astrometric instrument in space. We describe the simulation in detail, and provide an example of its use in predicting the measurement performance of the AMEX instrument.

Citation Download Citation

Bryan N. Dorland "Modeling the effects of proton damage to CCDs on astrometric measurement precision", Proc. SPIE 5167, Focal Plane Arrays for Space Telescopes, (12 January 2004); https://doi.org/10.1117/12.508590

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