Surface texture characterization using a chroma meter

Zhaowei Zhong

doi:10.1117/12.474041

17 February 2003 Surface texture characterization using a chroma meter

Zhaowei Zhong

Proceedings Volume 4833, Applications of Photonic Technology 5; (2003) https://doi.org/10.1117/12.474041
Event: Applications of Photonic Technology 5, 2002, Quebec City, Canada

Abstract

This paper discusses surface texture characterization of silicon, silicon carbide and some metal surfaces using a Chroma Meter. The specimen surfaces were obtained with various machining methods. Lightness (brightness) has a good correlation with surface roughness and could be used as an in-process/in-cycle/post-process technique for surface texture characterization. Surfaces with lower roughness values had lower lightness values.

Citation Download Citation

Zhaowei Zhong "Surface texture characterization using a chroma meter", Proc. SPIE 4833, Applications of Photonic Technology 5, (17 February 2003); https://doi.org/10.1117/12.474041

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