Paper
29 October 2001 Photoelastic modulation polarimetry and its measurement of twisted nematic liquid crystal
Yu-Faye Chao, Andrew Lin, M. W. Wang
Author Affiliations +
Proceedings Volume 4595, Photonic Systems and Applications; (2001) https://doi.org/10.1117/12.446589
Event: International Symposium on Photonics and Applications, 2001, Singapore, Singapore
Abstract
For in situ/real time measurement, a retarder is substituted by a photoelastic modulator (PEM) in a polarimetry. The azimuthal position of the strain axis of PEM is directly determined with respect to the orientation of the transmission axis of polarizer and analyzer. The Mueller matrix of a twisted nematic liquid crystal (TN-LCD) is derived analytically. The phase retardation and the twisted angle of a TN-LCD are numerically obtained through two successive measurements of the Mueller polarimeter.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yu-Faye Chao, Andrew Lin, and M. W. Wang "Photoelastic modulation polarimetry and its measurement of twisted nematic liquid crystal", Proc. SPIE 4595, Photonic Systems and Applications, (29 October 2001); https://doi.org/10.1117/12.446589
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KEYWORDS
Polarimetry

Wave plates

Modulation

Liquid crystals

Polarizers

Bessel functions

Photoelasticity

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