Focusability of a capillary discharge-pumped soft x-ray laser beam

Yanwei Liu; Jared Caffey; Igor Artioukov; Alexander V. Vinogradov; Jorge J. G. Rocca; David T. Attwood Jr.

doi:10.1117/12.450601

12 December 2001 Focusability of a capillary discharge-pumped soft x-ray laser beam

Yanwei Liu, Jared Caffey, Igor Artioukov, Alexander V. Vinogradov, Jorge J. G. Rocca, David T. Attwood Jr.

Proceedings Volume 4505, Soft X-Ray Lasers and Applications IV; (2001) https://doi.org/10.1117/12.450601
Event: International Symposium on Optical Science and Technology, 2001, San Diego, CA, United States

Abstract

Soft x-ray lasers have become practical light sources for applications such as interferometric diagnosis of plasmas, the measurement of optical constants, and the characterization of EUV optics. For many potential applications involving light-matter interaction and nonlinear physics, the achievable light intensity is a critical parameter. High intensity could be realized by focusing high pulse energy light with good beam quality. Recent progress at Colorado State University has realized milli-joule level pulse energy at 46.9 nm from a capillary discharge-pumped tabletop soft x-ray laser. Direct measurements of the spatial coherence of the laser beam using a two-pinhole interference method have shown very high spatial coherence of the beam. These results imply the possibility of achieving very high intensity in the soft x-ray region. In this paper we report the results of a focusing experiment conducted with the laser mentioned above and designed to measure the focusability of the beam. The spatial profile of the focused beam is measured with knife-edge scanning technique and characterized with an M-squared factor. The results suggest that 10¹³ W/cm² intensity is achievable with modestly tight focusing.

Citation Download Citation

Yanwei Liu, Jared Caffey, Igor Artioukov, Alexander V. Vinogradov, Jorge J. G. Rocca, and David T. Attwood Jr. "Focusability of a capillary discharge-pumped soft x-ray laser beam", Proc. SPIE 4505, Soft X-Ray Lasers and Applications IV, (12 December 2001); https://doi.org/10.1117/12.450601

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