Paper
4 May 2001 Commercialization of Honeywell's VCSEL technology: further developments
James K. Guenter, Jim A. Tatum, Andrew Clark, R. Scott Penner, Ralph H. Johnson, Robert A. Hawthorne III, J. Robert Biard, Yue Liu
Author Affiliations +
Abstract
Each year, more VCSEL technologies make the transition from research curiosities to commercially available products. In this paper we describe several such technologies at Honeywell, each at a different stage of that transition. Oxide-confined devices are already past the transition stage. We describe the generally excellent reliability of oxide-confined devices already in high-volume production, and compare it to results of the most recent-and possibly last-long-term reliability study of proton-implanted VCSELs. We report on detailed package-VCSEL interaction modeling, which is being used to improve performance and extend the life of common form-factor packages. We also note Honeywell's progress toward commercialization of VCSELs and allied products at wavelengths other than 850 nm.
© (2001) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James K. Guenter, Jim A. Tatum, Andrew Clark, R. Scott Penner, Ralph H. Johnson, Robert A. Hawthorne III, J. Robert Biard, and Yue Liu "Commercialization of Honeywell's VCSEL technology: further developments", Proc. SPIE 4286, Vertical-Cavity Surface-Emitting Lasers V, (4 May 2001); https://doi.org/10.1117/12.424790
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Cited by 31 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Reliability

Data modeling

Oxides

Semiconducting wafers

Capacitance

Manufacturing

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