Characterization of the critical behavior of Ising thin films

Manuel I. Marques; Julio A. Gonzalo; Juan Romero; Luis F. Fonesca

doi:10.1117/12.408405

29 November 2000 Characterization of the critical behavior of Ising thin films

Manuel I. Marques, Julio A. Gonzalo, Juan Romero, Luis F. Fonesca

Proceedings Volume 4086, Fourth International Conference on Thin Film Physics and Applications; (2000) https://doi.org/10.1117/12.408405
Event: 4th International Conference on Thin Film Physics and Applications, 2000, Shanghai, China

Abstract

Monte Carlo calculations of Ising thin films with equal area (LXL) and different thickness (D) have been performed for D<<L. The thickness dependence of the transition temperature has been determined by the Binder Cumulant method for free and periodic boundary conditions. We find that, in the case of very small thicknesses, the expected critical temperature finite size scaling dependence holds just for the case of periodic boundary conditions. The effective critical exponents for Ising thin films have been determined all through the crossover region and before it. We determine explicitly the dimensional crossover to the 2D behavior for all exponents and for both boundary conditions. A marked under-swing effect is found for the susceptibility effective critical exponent at values of the thickness around D equals 10. Scaling relationships are checked all trough the crossover region. They seem to hold better in a zone inside the crossover region with maximum extent for values of the thicknesses around D equals 5 and become more undefined below and above this D value.

Citation Download Citation

Manuel I. Marques, Julio A. Gonzalo, Juan Romero, and Luis F. Fonesca "Characterization of the critical behavior of Ising thin films", Proc. SPIE 4086, Fourth International Conference on Thin Film Physics and Applications, (29 November 2000); https://doi.org/10.1117/12.408405

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