Paper
1 May 2000 Large-area single-mode selectively oxidized VCSELs: approaches and experimental
Heiko J. Unold, Sawat W. Z. Mahmoud, Franz Eberhard, Roland Jaeger, Max Kicherer, Felix Mederer, Michael C. Riedl, Karl Joachim Ebeling
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Abstract
We present the investigation of several methods to increase the active diameter of single transverse mode oxide confined VCSELs in both the 850 and 980 nm wavelength regimes. Among the concepts considered are mode intensity specific shallow surface etched reliefs, monolithically increased cavity lengths, current confinement matching the fundamental mode intensity distribution and saturable absorbers. All approaches are introduced in theoretical considerations and corresponding measurement results are presented. Additionally, numerical simulations are performed to gain an increased understanding of some of the mode selection mechanisms. The considered concepts are evaluated in terms of decrease of the series resistance (for impedance matching/driving reasons) and device lifetime (as derived from maximum current densities). The results obtained are also compared to other approaches found in literature (e.g. metal apertures, photocurrent feedback, Fabry-Perot etalon, half-symmetric cavity). Conventional devices with optimized thin oxide aperture location have shown single-mode output powers above 4 mW with an active diameter of 3.5 micrometer. A record high single-transverse mode output power of 5 mW at a series resistance of 98 (Omega) is obtained for a 7 micrometer aperture device by increasing the cavity length monolithically by 4 micrometer.
© (2000) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Heiko J. Unold, Sawat W. Z. Mahmoud, Franz Eberhard, Roland Jaeger, Max Kicherer, Felix Mederer, Michael C. Riedl, and Karl Joachim Ebeling "Large-area single-mode selectively oxidized VCSELs: approaches and experimental", Proc. SPIE 3946, Vertical-Cavity Surface-Emitting Lasers IV, (1 May 2000); https://doi.org/10.1117/12.384377
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Cited by 18 scholarly publications.
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KEYWORDS
Vertical cavity surface emitting lasers

Resistance

Oxides

Mirrors

Etching

Refractive index

Data transmission

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