Exploratory search for improved oxidizing agents used in the reduction of surface leakage currents of CdZnTe detectors

Gomez W. Wright; Douglas Chinn; Bruce Andrew Brunett; Mark J. Mescher; James C. Lund; Richard W. Olsen; F. Patrick Doty; Tuviah E. Schlesinger; Ralph B. James; Kaushik Chattopadhyay; Robert Cam Wingfield; Arnold Burger

doi:10.1117/12.366617

19 October 1999 Exploratory search for improved oxidizing agents used in the reduction of surface leakage currents of CdZnTe detectors

Gomez W. Wright, Douglas Chinn, Bruce Andrew Brunett, Mark J. Mescher, James C. Lund, Richard W. Olsen, F. Patrick Doty, Tuviah E. Schlesinger, Ralph B. James, Kaushik Chattopadhyay, Robert Cam Wingfield, Arnold Burger

Author Affiliations +

Proceedings Volume 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics; (1999) https://doi.org/10.1117/12.366617
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1999, Denver, CO, United States

Abstract

We have studied the ability of different oxidizing agents, other than H₂O₂ to reduce the surface leakage current of CdZnTe devices. All chemical treatments were performed in aqueous solutions, at room temperature, with weight percent concentrations of 2.5g/25ml. Before and after I-V curves were obtained. It was found that by increasing the basicity of the chemical treatment, greater reduction in surface leakage current occurred. The result show that these alternative chemical treatments reduced the surface leakage current as well as or better than H₂O₂ chemical treatment.

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Gomez W. Wright, Douglas Chinn, Bruce Andrew Brunett, Mark J. Mescher, James C. Lund, Richard W. Olsen, F. Patrick Doty, Tuviah E. Schlesinger, Ralph B. James, Kaushik Chattopadhyay, Robert Cam Wingfield, and Arnold Burger "Exploratory search for improved oxidizing agents used in the reduction of surface leakage currents of CdZnTe detectors", Proc. SPIE 3768, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics, (19 October 1999); https://doi.org/10.1117/12.366617

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