Paper
7 May 1999 Attenuated phase-shifting mask and its encoding method
Chongxi Zhou, Feng Boru, Desheng Hou, Jin Zhang
Author Affiliations +
Proceedings Volume 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99); (1999) https://doi.org/10.1117/12.347714
Event: Optical Engineering for Sensing and Nanotechnology (ICOSN '99), 1999, Yokohama, Japan
Abstract
Attenuated phase shifting mask and that with optical proximity correction is adopted to improve resolution of photolithography based on some calculation results. The first factor k1 of the photolithography could be to 0.50, and the optimal transmission is about to 8 to approximately 10%. And a new kind of method of making attenuated phase shifting mask by encoding is put forward, and the theoretical calculation results are accordant to the conventional attenuated shifting mask.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Chongxi Zhou, Feng Boru, Desheng Hou, and Jin Zhang "Attenuated phase-shifting mask and its encoding method", Proc. SPIE 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99), (7 May 1999); https://doi.org/10.1117/12.347714
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KEYWORDS
Photomasks

Computer programming

Phase shifting

Optical lithography

Optical proximity correction

Phase shifts

Semiconducting wafers

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