Paper
13 January 1999 Optical and microwave technologies for inspection of industrial and geochemical anomalies in the gas-atmospheric boundary layer
Yurii D. Kopytin, Victor V. Nosov, Liliya K. Chistyakova
Author Affiliations +
Proceedings Volume 3583, Fifth International Symposium on Atmospheric and Ocean Optics; (1999) https://doi.org/10.1117/12.337072
Event: Fifth International Symposium on Atmospheric and Ocean Optics, 1998, Tomsk, Russian Federation
Abstract
This paper presents new results obtained by the authors in the development of technologies for monitoring the atmospheric boundary layer anomalies, caused by the microgeochemical conditions or industrial pollution emissions.
© (1999) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yurii D. Kopytin, Victor V. Nosov, and Liliya K. Chistyakova "Optical and microwave technologies for inspection of industrial and geochemical anomalies in the gas-atmospheric boundary layer", Proc. SPIE 3583, Fifth International Symposium on Atmospheric and Ocean Optics, (13 January 1999); https://doi.org/10.1117/12.337072
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KEYWORDS
Refraction

Atmospheric monitoring

Pollution

Atmospheric optics

Atmospheric particles

Receivers

Aerosols

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