3D measurement of an aspherical surface with a one-interferogram method

Wensheng Wang; Yang Xiang; Haicheng Zhang

doi:10.1117/12.318327

5 August 1998 3D measurement of an aspherical surface with a one-interferogram method

Wensheng Wang, Yang Xiang, Haicheng Zhang

Proceedings Volume 3557, Current Developments in Optical Elements and Manufacturing; (1998) https://doi.org/10.1117/12.318327
Event: Photonics China '98, 1998, Beijing, China

Abstract

In this paper, with the aid of Fourier transform and reverse Fourier transform not only 2D contour map, but also 3D plot of a tested aspherical surface is obtained by 1- interferogram method, so a simple method is provided for autocontrolling machine-shaping of an aspherical surface. In order to test a variety of aspherical surface, a quasi- universal compensator is designed. The experiment setup for testing aspherical surface is Tywman-CCD-computer system.

Citation Download Citation

Wensheng Wang, Yang Xiang, and Haicheng Zhang "3D measurement of an aspherical surface with a one-interferogram method", Proc. SPIE 3557, Current Developments in Optical Elements and Manufacturing, (5 August 1998); https://doi.org/10.1117/12.318327

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