Portable I2-stabilized Nd:YAG laser for wavelength standards at 532 nm and 1064 nm

Feng-Lei Hong; Jun Ishikawa; Tai Hyun Yoon; Long-Sheng Ma; Jun Ye; John L. Hall

doi:10.1117/12.323092

30 September 1998 Portable I2-stabilized Nd:YAG laser for wavelength standards at 532 nm and 1064 nm

Feng-Lei Hong, Jun Ishikawa, Tai Hyun Yoon, Long-Sheng Ma, Jun Ye, John L. Hall

Author Affiliations +

Proceedings Volume 3477, Recent Developments in Optical Gauge Block Metrology; (1998) https://doi.org/10.1117/12.323092
Event: SPIE's International Symposium on Optical Science, Engineering, and Instrumentation, 1998, San Diego, CA, United States

Abstract

We have established a portable I₂-stabilized Nd:YAG laser for the purpose of making wavelength standards at 532 nm and 1064 nm. All the optical parts of the laser systems were arranged on a 45 cm X 45 cm breadboard. The system was transported from NRLM to JILA for frequency comparison. The results of the comparison show that the Allan Variance of the portable laser reached < 3 X 10^-13 when the integration time (tau) is larger than 100 s. The frequency differences between the NRLM and JILA lasers during 3-day measurements were consistent within +/- 35 Hz, but the matrix-averaged standard deviation of about 310 Hz, and offset are regarded as not yet fully satisfactory. The stability of the portable laser was further improved to about 3 X 10^-14 by using a longer iodine cell and several frequency stabilization techniques.

Citation Download Citation

Feng-Lei Hong, Jun Ishikawa, Tai Hyun Yoon, Long-Sheng Ma, Jun Ye, and John L. Hall "Portable I2-stabilized Nd:YAG laser for wavelength standards at 532 nm and 1064 nm", Proc. SPIE 3477, Recent Developments in Optical Gauge Block Metrology, (30 September 1998); https://doi.org/10.1117/12.323092

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