Paper
8 October 1998 Methods for absolute reflectance measurement of transmissive materials in the infrared
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Abstract
Four methods for the measurement of absolute reflectance are described and compared, with particular emphasis on application to transmissive materials such as windows and filters. Three of the methods, the 'V-W,' 'V-N,' and goniometer based methods, have been in use for a number of years. The fourth is an integrating sphere method. The sphere system is used for both specular and diffuse samples but achieves its greatest accuracy in the measurement of specular reflectance and transmittance. A direct comparison of the sphere and goniometer methods is made on samples in the infrared spectral region.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Leonard M. Hanssen and Simon G. Kaplan "Methods for absolute reflectance measurement of transmissive materials in the infrared", Proc. SPIE 3425, Optical Diagnostic Methods for Inorganic Transmissive Materials, (8 October 1998); https://doi.org/10.1117/12.326674
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Reflectivity

Optical spheres

Transmittance

Mirrors

Integrating spheres

Sensors

Infrared radiation

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