Noise Measurements In Self-Oscillating Mixers

Samuel Dixon Jr.

doi:10.1117/12.965932

22 October 1982 Noise Measurements In Self-Oscillating Mixers

Samuel Dixon Jr.

Proceedings Volume 0337, Millimeter Wave Technology I; (1982) https://doi.org/10.1117/12.965932
Event: 1982 Technical Symposium East, 1982, Arlington, United States

Abstract

Noise measurements on the self-oscillating mixer at 60 GHz have been made in both GaAs and InP Gnn devices. These devices were fabricated using an image guide design as the transmission media. The double side-band noise figure and conversion characteristics were measured and it is shown that the noise performance of these devices make them attractive for application where low cost, simplicity in circuitry, and small physical size are important factors.

Citation Download Citation

Samuel Dixon Jr. "Noise Measurements In Self-Oscillating Mixers", Proc. SPIE 0337, Millimeter Wave Technology I, (22 October 1982); https://doi.org/10.1117/12.965932

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available