Paper
20 April 1998 Vacuum-thermal-deposited films of organic dyes as sensitive materials in electrodigit visualization processes
J. A. Zhizhenko, Vladimir Enokovich Agabekov, Yu. K. Mikhailovskii, E. V. Kotov
Author Affiliations +
Proceedings Volume 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997; (1998) https://doi.org/10.1117/12.306263
Event: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics, 1997, Kiev, Ukraine
Abstract
The method of electrodigit diagnostics is based on registration of a picture luminescence of object, placed in a high-frequency high-voltage field. It lets to reveal surface heterogeneity of a various nature, defects conductor under a layer optical opaque dielectric or in most dielectric. Early it is offered to replace traditionally used in this method halogensilver materials for vacuum thermal deposition (VTD) on dielectric of a substrate by thin layers organic dyes, that will make a method more technological and cheap. In the given work the spectral methods have qualitatively appreciated a role making of (electronic, x-ray, ultraviolet and visible radiations) in formation of the electrodigit image in VTD-films of Rhodamine 6G (R-6G) and dye of a class Oxazine (OX-1). It is established, that: (1) the contribution all making (except UV-radiation) in formation of a drawing in VTD-films of R-6G and OX-1 is insignificant; (2) the visible image in a VTD- film of R-6G will be formed for the account of decomposition of dye by `rigid' UV-radiation; (3) the influence of 1 sec. of the crown discharge on 0,68-micrometers a VTD-film of OX-1 is equivalent of irradiation her 365 nm by a doze 0,8 J/cm2.
© (1998) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. A. Zhizhenko, Vladimir Enokovich Agabekov, Yu. K. Mikhailovskii, and E. V. Kotov "Vacuum-thermal-deposited films of organic dyes as sensitive materials in electrodigit visualization processes", Proc. SPIE 3359, Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics 1997, (20 April 1998); https://doi.org/10.1117/12.306263
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KEYWORDS
Visible radiation

Dielectrics

Image processing

Visualization

X-rays

Absorption

Diagnostics

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