Measurement of stress birefringence in optical disk substrates

Xishan Li; Wendong Xu; Li Zhu

doi:10.1117/12.248714

3 September 1996 Measurement of stress birefringence in optical disk substrates

Xishan Li, Wendong Xu, Li Zhu

Proceedings Volume 2931, Fourth International Symposium on Optical Storage (ISOS '96); (1996) https://doi.org/10.1117/12.248714
Event: Fourth International Symposium on Optical Storage, 1996, Shenzhen, Guangdong Province, China

Abstract

The theory and experimental analysis has been made in this paper for the change of phase retardation in optical disk substrates when light beams pass through them from different incident angles. We tested the PC and glass substrate by using a polarization phase modulation method with Polarizer- Modulation-Compensator-Specimen-Analyzer structure.

Citation Download Citation

Xishan Li, Wendong Xu, and Li Zhu "Measurement of stress birefringence in optical disk substrates", Proc. SPIE 2931, Fourth International Symposium on Optical Storage (ISOS '96), (3 September 1996); https://doi.org/10.1117/12.248714

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