Inverse scattering for rough surfaces

C. J. R. Sheppard

doi:10.1117/12.2299023

1 September 1996 Inverse scattering for rough surfaces

C. J. R. Sheppard

Proceedings Volume 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology; 27783X (1996) https://doi.org/10.1117/12.2299023
Event: 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 1996, Taejon, Korea, Republic of

Abstract

Reconstruction of surface profiles from scattering data is considered in the Kirchhoff aproximation. For reconstruction of the profile phase information is required. For surfaces with Gaussian height variation, the autocorrelation function can be determined from intensity data.

Citation Download Citation

C. J. R. Sheppard "Inverse scattering for rough surfaces", Proc. SPIE 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology, 27783X (1 September 1996); https://doi.org/10.1117/12.2299023

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available