Paper
19 August 1996 Ellipsometric analysis of quasirugate films: regularization technique revisited
Jiri Hrdina, Jaroslav Sobota, Vratislav Perina
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Abstract
Analysis of refractive index profiles of rugate and quasi- rugate films from measurements requires special techniques to avoid destabilization of solution due to a large number of fitted parameters. Regularization technique suggested recently takes into account a priori information about the index profile by adding the so called stabilizing operator to the merit function. We propose a more general form of this operator and different model of the system thus allowing for better correspondence between the stabilizer and a priori information. The new technique is demonstrated on the analysis of rf magnetron sputtered quasi-rugate films of SiO2/TiO2 with nominally linear material composition profiles and the results are compared to profiles established from Rutherford backscattering spectroscopy measurements.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jiri Hrdina, Jaroslav Sobota, and Vratislav Perina "Ellipsometric analysis of quasirugate films: regularization technique revisited", Proc. SPIE 2776, Developments in Optical Component Coatings, (19 August 1996); https://doi.org/10.1117/12.246828
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KEYWORDS
Refractive index

Protactinium

Statistical analysis

Backscatter

Spectroscopy

Systems modeling

Argon

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