Fuzzy logic application to quality and reliability in microelectronics

Bruno Bosacchi

doi:10.1117/12.243258

14 June 1996 Fuzzy logic application to quality and reliability in microelectronics

Bruno Bosacchi

Author Affiliations +

Proceedings Volume 2761, Applications of Fuzzy Logic Technology III; (1996) https://doi.org/10.1117/12.243258
Event: Aerospace/Defense Sensing and Controls, 1996, Orlando, FL, United States

Abstract

This paper discusses the application of fuzzy logic to quality and reliability issues in microelectronics. After a general introduction, the potential role of fuzzy logic is reviewed at various stages of the production process: testing, process control, and design for reliability and quality.

Citation Download Citation

Bruno Bosacchi "Fuzzy logic application to quality and reliability in microelectronics", Proc. SPIE 2761, Applications of Fuzzy Logic Technology III, (14 June 1996); https://doi.org/10.1117/12.243258

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