Soft-error-rate model for optimizing MR read and write widths

Mathew P. Vea

doi:10.1117/12.228227

8 December 1995 Soft-error-rate model for optimizing MR read and write widths

Mathew P. Vea

Proceedings Volume 2605, Coding and Signal Processing for Information Storage; (1995) https://doi.org/10.1117/12.228227
Event: Photonics East '95, 1995, Philadelphia, PA, United States

Abstract

We describe a semi-empirical model that predicts the soft error rate of a magnetic recording system with magnetoresistive heads. The model has a small number of input parameters that define the read and write widths of the head as well as the on-track performance and the susceptibility to off-track interference of the read channel. The model has been tested by comparison to off-track error rate data from a peak detect channel, with good agreement, and by comparison to another soft error rate model developed by Wiesen, et. al. The two models agree on the optimal write width for a 4.3 micrometer track pitch, but our model predicts a smaller optimal read width than the Wiesen model. Off-track error rate curves and on-track error vs. head width curves from the two models are compared to understand this difference in predicted optimal read width.

Citation Download Citation

Mathew P. Vea "Soft-error-rate model for optimizing MR read and write widths", Proc. SPIE 2605, Coding and Signal Processing for Information Storage, (8 December 1995); https://doi.org/10.1117/12.228227

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