Nondestructive characterization of Ti-doped and V-doped CdTe by time-dependent charge measurement

Clemens Eiche; Ralf Schwarz; Wolfgang Joerger; Michael Fiederle; Dirk G. Ebling; Klaus-Werner Benz

doi:10.1117/12.218197

1 September 1995 Nondestructive characterization of Ti-doped and V-doped CdTe by time-dependent charge measurement

Clemens Eiche, Ralf Schwarz, Wolfgang Joerger, Michael Fiederle, Dirk G. Ebling, Klaus-Werner Benz

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Proceedings Volume 2554, Growth and Characterization of Materials for Infrared Detectors II; (1995) https://doi.org/10.1117/12.218197
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

As a nondestructive, contactless characterization method time dependent charge measurements (TDCM) are used for the investigation of high resistivity CdTe doped with vanadium or titanium. TDCM is presented as a multi-purpose technique which allows for the examination of the resistivity, the thermal activation energy of the charge carriers, the photosensitivity and the surface voltage (SPV). Strong axial variations of the physical properties are observed as a consequence of the segregation of the dopants.

Citation Download Citation

Clemens Eiche, Ralf Schwarz, Wolfgang Joerger, Michael Fiederle, Dirk G. Ebling, and Klaus-Werner Benz "Nondestructive characterization of Ti-doped and V-doped CdTe by time-dependent charge measurement", Proc. SPIE 2554, Growth and Characterization of Materials for Infrared Detectors II, (1 September 1995); https://doi.org/10.1117/12.218197

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