Automated measurement of scattering intensity

Xiange Han; Zhensen Wu; Xiangdong Zhang

doi:10.1117/12.218292

8 September 1995 Automated measurement of scattering intensity

Xiange Han, Zhensen Wu, Xiangdong Zhang

Proceedings Volume 2552, Infrared Technology XXI; (1995) https://doi.org/10.1117/12.218292
Event: SPIE's 1995 International Symposium on Optical Science, Engineering, and Instrumentation, 1995, San Diego, CA, United States

Abstract

In this paper, the constitutional characteristic and performance of an automated scattering measurement system is introduced. The angular distributions of laser scattering intensity for some rough plane samples are measured at 0.63 micrometer and 0.904 micrometer. The materials of these samples include aluminum, stell, carbon and paints. The dependence of angular intensities on dielectric constant, roughness, and wavelength are analyzed.

Citation Download Citation

Xiange Han, Zhensen Wu, and Xiangdong Zhang "Automated measurement of scattering intensity", Proc. SPIE 2552, Infrared Technology XXI, (8 September 1995); https://doi.org/10.1117/12.218292

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