Paper
4 January 1995 Surface quality inspection by using the contact and light procedures
Josef Mandak
Author Affiliations +
Proceedings Volume 2349, Industrial Optical Sensors for Metrology and Inspection; (1995) https://doi.org/10.1117/12.198687
Event: Photonics for Industrial Applications, 1994, Boston, MA, United States
Abstract
The paper describes the present design of contact profile meters for evaluating of topography-roughness of machine part surfaces by the quality inspection in the manufacturing processes, including automated ones. Considerable attention is paid to the surfaces with a difficult or no access for the contact profile meter. In order to scan these surfaces of machine parts an experimental measuring device of module conception has been designed that works on the light principle and utilizes elements of laser technique. Interesting original experimental results are given that have been obtained by both, contact and light procedure. They explain in greater detail the given problems that are attractive especially from the standpoint of the quality inspection in the perspective automated production.
© (1995) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Josef Mandak "Surface quality inspection by using the contact and light procedures", Proc. SPIE 2349, Industrial Optical Sensors for Metrology and Inspection, (4 January 1995); https://doi.org/10.1117/12.198687
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KEYWORDS
Inspection

Surface roughness

Light scattering

Measurement devices

Optical fibers

Reflectivity

Fiber optics

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