Field measurement technique for infrared camera characterization

Alexis P. Tzannes

doi:10.1117/12.188676

17 October 1994 Field measurement technique for infrared camera characterization

Alexis P. Tzannes

Author Affiliations +

Proceedings Volume 2269, Infrared Technology XX; (1994) https://doi.org/10.1117/12.188676
Event: SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation, 1994, San Diego, CA, United States

Abstract

This paper is an extension of previous work which dealt with characterizing the performance of staring PtSi infrared cameras, based on estimating their spatial frequency response. Applying a modified knife edge technique, we arrive at an estimate of the edge spread function (ESF), which is used to obtain a profile through the center of the two-dimensional modulation transfer function (MTF). In this paper, we demonstrate that this technique is applicable as a field measurement. The resolution of the system can be calculated using the width of the line spread function (LSF) and an image of an object of known width. In addition, by applying this technique at long range, the MTF of the atmosphere can be measured.

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Alexis P. Tzannes "Field measurement technique for infrared camera characterization", Proc. SPIE 2269, Infrared Technology XX, (17 October 1994); https://doi.org/10.1117/12.188676

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KEYWORDS

Modulation transfer functions

Infrared cameras

Cameras

Infrared technology

Spatial frequencies

Image processing

Image resolution

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