Characterization of porous silicon by microscopic Fourier transform infrared spectroscopy

Adele Sassella; Alessandro Borghesi; B. Pivac; Lorenzo Pavesi

doi:10.1117/12.166806

31 January 1994 Characterization of porous silicon by microscopic Fourier transform infrared spectroscopy

Adele Sassella, Alessandro Borghesi, B. Pivac, Lorenzo Pavesi

Proceedings Volume 2089, 9th International Conference on Fourier Transform Spectroscopy; (1994) https://doi.org/10.1117/12.166806
Event: Fourier Transform Spectroscopy: Ninth International Conference, 1993, Calgary, Canada

Abstract

Infrared absorption of luminescent porous silicon has been measured with high spatial resolution to study the local chemical composition. A few typical spectra, which evidence the presence of impurities such as H, O, and C in different bonding configurations, have been selected as the most significant and analyzed.

Citation Download Citation

Adele Sassella, Alessandro Borghesi, B. Pivac, and Lorenzo Pavesi "Characterization of porous silicon by microscopic Fourier transform infrared spectroscopy", Proc. SPIE 2089, 9th International Conference on Fourier Transform Spectroscopy, (31 January 1994); https://doi.org/10.1117/12.166806

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available