Modification of spectral characteristics of multilayer dielectric systems

Ishtvan V. Fekeshgazi; Yury A. Pervak

doi:10.1117/12.141033

4 March 1993 Modification of spectral characteristics of multilayer dielectric systems

Ishtvan V. Fekeshgazi, Yury A. Pervak

Proceedings Volume 1782, Thin Films for Optical Systems; (1993) https://doi.org/10.1117/12.141033
Event: Optical Systems Design '92, 1992, Berlin, Germany

Abstract

The relationship between the speotral responee oharacteristios of some two or three component dielectric systems and optical thicknesses and refractive indices of the layers are discussed. A solution of the problem of suppressing the high reflection zone at the fifth harmonic frequency, while maintaing high reflection at the operating frequency, is proposed for the non-equal thick two component multilayer system. Also are considered the characteristics of the three component systems ensuering high reflection on the operating wavelenght at a high transmittance in the broad spectral region including the frequency bands of the second and third haronics.

Citation Download Citation

Ishtvan V. Fekeshgazi and Yury A. Pervak "Modification of spectral characteristics of multilayer dielectric systems", Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); https://doi.org/10.1117/12.141033

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