Determination of reflectivity curves of multilayer neutron monochromators

Alexander Mihai Popovici; Brent J. Heuser; William B. Yelon; John E. Keem

doi:10.1117/12.130631

23 November 1992 Determination of reflectivity curves of multilayer neutron monochromators

Alexander Mihai Popovici, Brent J. Heuser, William B. Yelon, John E. Keem

Proceedings Volume 1738, Neutron Optical Devices and Applications; (1992) https://doi.org/10.1117/12.130631
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The technique of measuring neutron multilayer monochromator reflectivities by double diffraction rocking curves is discussed. Two problems encountered are deposition induced curvature of multilayer support and lateral variation of layer spacing. Transmitted rocking curves were measured with a narrow detector in an effort to understand these specific problems. General formulae for interpretation of such rocking curves are derived and the methodology for determining relevant parameters is discussed. Measured reflectivities of 10 nm spacing Ni-Ti multilayer devices are presented. Consideration of support curvature and layer spacing variation is essential in understanding observed data.

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Alexander Mihai Popovici, Brent J. Heuser, William B. Yelon, and John E. Keem "Determination of reflectivity curves of multilayer neutron monochromators", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130631

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