Wavelengthometry by double-refracting interferometry

Maksymilian Pluta

doi:10.1117/12.155681

24 September 1993 Wavelengthometry by double-refracting interferometry

Maksymilian Pluta

Author Affiliations +

Proceedings Volume 1711, High-Performance Optical Spectrometry; (1993) https://doi.org/10.1117/12.155681
Event: High Performance Optical Spectrometry, 1992, Warsaw, Poland

Abstract

A double-refractig interference system with variable wavefront shear has been adapted to wave- lengthmetry ot nochromatic light. The interfrixige spacing is directly measured while the wavelength is read out frog a calibration plot or a data table stored in the computer mery. The proposed technique is especially suitable or aauring the peak wavelength o nocbroatic intererence filters. The measuring accuracy as good as Al = m is easily achievable.

Citation Download Citation

Maksymilian Pluta "Wavelengthometry by double-refracting interferometry", Proc. SPIE 1711, High-Performance Optical Spectrometry, (24 September 1993); https://doi.org/10.1117/12.155681

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

;

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE