Study of anomalous scatter characteristics

John C. Stover; Marvin L. Bernt; Timothy D. Henning

doi:10.1117/12.50508

1 December 1991 Study of anomalous scatter characteristics

John C. Stover, Marvin L. Bernt, Timothy D. Henning

Proceedings Volume 1530, Optical Scatter: Applications, Measurement, and Theory; (1991) https://doi.org/10.1117/12.50508
Event: San Diego, '91, 1991, San Diego, CA, United States

Abstract

Anomalous, or non-topographic, scatter from beryllium optics at IR wavelengths has been recognized as a source of poor performance for space based IR imaging systems. This paper reports the results of experiments designed to discover clues as to the source of anomalous scatter so that it can be eliminated with new manufacturing techniques. Polarization, wavelength dependence and surface pitting were examined. None of these can be confirmed as the primary source of anomalous scatter based on the work completed to date.

Citation Download Citation

John C. Stover, Marvin L. Bernt, and Timothy D. Henning "Study of anomalous scatter characteristics", Proc. SPIE 1530, Optical Scatter: Applications, Measurement, and Theory, (1 December 1991); https://doi.org/10.1117/12.50508

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