Paper
1 July 1991 Notch and large-area CCD imagers
Richard A. Bredthauer, Jeff H. Pinter, James R. Janesick, Lloyd B. Robinson
Author Affiliations +
Abstract
A technique for improving the performance oflarge area high resolution Charge-Coupled Device (CCD) imagers will be described. Adding an additional doped channel down the center of a CCD register provides for charge confinement. This leads to improved charge transfer efficiency and resistance to radiation damage. Two dimenslonal theoretical analysis will be shown along with measured device performance.
© (1991) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard A. Bredthauer, Jeff H. Pinter, James R. Janesick, and Lloyd B. Robinson "Notch and large-area CCD imagers", Proc. SPIE 1447, Charge-Coupled Devices and Solid State Optical Sensors II, (1 July 1991); https://doi.org/10.1117/12.45335
Lens.org Logo
CITATIONS
Cited by 16 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Charge-coupled devices

Imaging systems

Optical sensors

Doping

Solid state electronics

CCD image sensors

Asteroids

RELATED CONTENT

Large Area CCD Image Sensors For Scientific Applications
Proceedings of SPIE (December 11 1985)
Large format 1280 x 1024 full frame CCD image sensor...
Proceedings of SPIE (July 01 1991)
Retinalike space variant CCD sensor
Proceedings of SPIE (July 01 1990)
Solid state image sensor: technologies and applications
Proceedings of SPIE (June 18 1998)

Back to Top