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12 December 2024 Precision uncertainty analysis and correction of thru-reflect-match calibration technology in vector network analyzer measurement
Hua Zhuo, Wenyan Xue, Weihu Zhou, Guangcheng Jia, Lifang Yao, Xiaying Zhou
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Proceedings Volume 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024); 1343925 (2024) https://doi.org/10.1117/12.3055590
Event: Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 2024, Xiamen, China
Abstract
In the practical application of the vector network analyzer (VNA), the thru-reflect-match (TRM) calibration kits exhibit non-ideal performance due to the inevitable hardware damage and imperfect manufacture of precision devices. Consequently, the S-parameters of the tested devices deviate from their ideal values, leading to uncertainty in the measurements. This paper provides a detailed analysis of how non-ideal TRM calibration kits affect the uncertainty of Sparameter measurements. To start, we simplify error correction equations through the utilization of the concept of general nodal equations and matrix operations, culminating in a generalized equation describing the deviation of measured Sparameters relative to error terms. On this basis, expressions for the S-parameter sensitivity coefficient using TRM calibration technology are derived. Finally, the accuracy of these expressions is verified through comparative experiments. The research presented in this paper can determine the influence degree of various errors on S-parameters, thus optimizing the calibration process and providing guidance for quality control.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Hua Zhuo, Wenyan Xue, Weihu Zhou, Guangcheng Jia, Lifang Yao, and Xiaying Zhou "Precision uncertainty analysis and correction of thru-reflect-match calibration technology in vector network analyzer measurement", Proc. SPIE 13439, Fourth International Conference on Testing Technology and Automation Engineering (TTAE 2024), 1343925 (12 December 2024); https://doi.org/10.1117/12.3055590
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KEYWORDS
Calibration
Reflection
Matrices
Reflectors
Error control coding
Scattering
Network security
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