Optical coherence microscopy for quantitative ultrafast carriers imaging in semiconductor microstructures

Anna A. Popkova; Maxim A. Sirotin; Irina V. Soboleva; Vladimir O. Bessonov; Andrey A. Fedyanin

doi:10.1117/12.3035170

22 November 2024 Optical coherence microscopy for quantitative ultrafast carriers imaging in semiconductor microstructures

Anna A. Popkova, Maxim A. Sirotin, Irina V. Soboleva, Vladimir O. Bessonov, Andrey A. Fedyanin

Author Affiliations +

Proceedings Volume 13238, Advanced Optical Imaging Technologies VII; 132380E (2024) https://doi.org/10.1117/12.3035170
Event: SPIE/COS Photonics Asia, 2024, Nantong, Jiangsu, China

Abstract

Optical coherence microscopy is a promising method for visualization of the material refractive index, that is actively used for medical application. The implementation of the pump-probe scheme into optical coherence microscopy makes it possible to measure not only stationary quantities, but also to study the temporal dynamics of the optical properties changes of a sample under the optical pumping. In this work we demonstrate the possibility of the visualization of the refractive index modulation in semiconductor structures and estimation of the Q-factor of the excited resonances for lasing perovskite structure.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Anna A. Popkova, Maxim A. Sirotin, Irina V. Soboleva, Vladimir O. Bessonov, and Andrey A. Fedyanin "Optical coherence microscopy for quantitative ultrafast carriers imaging in semiconductor microstructures", Proc. SPIE 13238, Advanced Optical Imaging Technologies VII, 132380E (22 November 2024); https://doi.org/10.1117/12.3035170

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