Impact of space charge effects on ultrafast electron beam longitudinal profile diagnostics based on SPR

Shuangxin Li; Jiapeng Li; Yang Xu; Shuochun Yu; Zhengzheng Liu; Chengyin Tsai; Oleg Meshkov; Shizhong An; Kuanjun Fan

doi:10.1117/12.3025416

24 June 2024 Impact of space charge effects on ultrafast electron beam longitudinal profile diagnostics based on SPR

Shuangxin Li, Jiapeng Li, Yang Xu, Shuochun Yu, Zhengzheng Liu, Chengyin Tsai, Oleg Meshkov, Shizhong An, Kuanjun Fan

Proceedings Volume 13209, 2nd International Conference on UltrafastX 2023; 132090A (2024) https://doi.org/10.1117/12.3025416
Event: 2nd International Conference on UltrafastX 2023 (UX2023), 2023, Xi'an, China

Abstract

Accurate characterization of the longitudinal profile of ultrafast electron bunches is crucial for observing ultrafast dynamic processes in ultrafast electron diffraction (UED). Real-time monitoring of each ultrafast electron bunch's length would ideally provide a temporal basis for analyzing diffraction patterns. However, accurately and non-destructively measuring the longitudinal profile at the 10 femtoseconds level remains challenging. This paper investigates a method for monitoring the longitudinal profile of bunches using coherent Smith-Purcell radiation (cSPr). Space charge effects cause the elongation of electron bunches during flight, resulting in changes in the Smith-Purcell radiation spectrum. Therefore, the focus is on understanding the impact of space charge effects on the behavior of ultrafast electron bunches and their corresponding cSPr spectrum, with the aim of improving measurement accuracy.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Shuangxin Li, Jiapeng Li, Yang Xu, Shuochun Yu, Zhengzheng Liu, Chengyin Tsai, Oleg Meshkov, Shizhong An, and Kuanjun Fan "Impact of space charge effects on ultrafast electron beam longitudinal profile diagnostics based on SPR", Proc. SPIE 13209, 2nd International Conference on UltrafastX 2023, 132090A (24 June 2024); https://doi.org/10.1117/12.3025416

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KEYWORDS

Diagnostics

Ultrafast phenomena

Electron beams

Simulations

Terahertz radiation

Diffraction

Radiation effects

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