Annular gap width measurement based on sub-pixel edge fitting

Jiawei Zhang; Yongli Xu; Mingyang Liu; Yufeng Liu; Guangrong Du

doi:10.1117/12.3033061

5 July 2024 Annular gap width measurement based on sub-pixel edge fitting

Jiawei Zhang, Yongli Xu, Mingyang Liu, Yufeng Liu, Guangrong Du

Proceedings Volume 13184, Third International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024); 131845X (2024) https://doi.org/10.1117/12.3033061
Event: 3rd International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024), 2024, Kuala Lumpur, Malaysia

Abstract

To address the difficulty in measuring the annular joint gap structure with structured light, a detection method based on sub-pixel edge fitting is proposed. Firstly, the centerline is extracted by combining the directional template method with the gray centroid method, and then the laser groups are positioned accordingly. Secondly, The Zernike moment method is used to detect the sub-pixel contours of each pair of laser lines. Subsequently, the sub-pixel feature points of the light pattern are obtained by sliding the feature circle along the centerline. Finally, the gap value is determined by calculating the average distance between the fitted straight lines of the sub-pixel feature points. A single annular gap is selected for both visual measurement and manual feeler gauge measurement. The measurement results show that the error between the final measurement value of the proposed method and the manual feeler gauge measurement is no greater than 0.05mm. This indicates that this detection method exhibits good accuracy and high stability. This visual measurement method can meet the requirements for the measurement accuracy of annular joint gap widths.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Jiawei Zhang, Yongli Xu, Mingyang Liu, Yufeng Liu, and Guangrong Du "Annular gap width measurement based on sub-pixel edge fitting", Proc. SPIE 13184, Third International Conference on Electronic Information Engineering and Data Processing (EIEDP 2024), 131845X (5 July 2024); https://doi.org/10.1117/12.3033061

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KEYWORDS

Structured light

Edge detection

Inspection

Contour extraction

Visual inspection

3D metrology

Optical testing

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