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6 September 2024 Investigation of the effect of applying continuous wavelet analysis on the NIST FFT test passing performance of random noise generated by an InGaAs p-i-n photodiode-based optical random number generator
Mansur E. Sibgatullin, Danil A. Mavkov, Lenar R. Gilyazov, Narkis M. Arslanov
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Proceedings Volume 13168, Optical Technologies for Telecommunications 2023; 1316815 (2024) https://doi.org/10.1117/12.3026581
Event: Optical Technologies for Telecommunications 2023, 2023, Kazan, Russian Federation
Abstract
In this paper, a random noise study is carried out, generated by an optical random number generator based on an InGaAs p-i-n photodiode. The influence of the procedure of equalization of the energy values of the of the continuous wavelet transform on the efficiency of passing the test for the FFT randomness from the set of NIST statistical tests.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
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Mansur E. Sibgatullin, Danil A. Mavkov, Lenar R. Gilyazov, and Narkis M. Arslanov "Investigation of the effect of applying continuous wavelet analysis on the NIST FFT test passing performance of random noise generated by an InGaAs p-i-n photodiode-based optical random number generator", Proc. SPIE 13168, Optical Technologies for Telecommunications 2023, 1316815 (6 September 2024); https://doi.org/10.1117/12.3026581
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KEYWORDS
Quantum random number generation
Wavelets
Quantum hardware
Statistical analysis
Quantum numbers
Analytical research
Quantum processes
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