Presentation + Paper
18 October 2024 Extending the field-of-view of speckle-based microtomography with the UMPA model
Author Affiliations +
Abstract
Phase-contrast computed tomography enables the visualization of weakly-absorbing samples with high contrast. Speckle-based imaging (SBI) is a phase-sensitive X-ray imaging technique that requires the use of a wavefront marker (typically a sandpaper) to retrieve multi-modal information: absorption, refraction and scattering. These quantities are derived by analyzing the distortions in a reference pattern generated when the sample is inserted into the beam. The Unified Modulated Pattern Analysis (UMPA) model is a speckle-tracking method capable of processing such datasets. While high-resolution tomographic reconstructions can be achieved at the synchrotron, there is usually a trade-off with sample dimensions. Here, we use UMPA with a multi-frame approach for signal retrieval, enabling the expansion of the reconstructed field-of-view (FOV) by moving the sample instead of the modulator transversely to the beam. We demonstrate this technique on a human placental tissue sample.
Conference Presentation
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Sara Savatović, Fabio De Marco, Mirko Riedel, Davis J. Laundon, Michèle-Louise Regner, Jörg U. Hammel, Rohan M. Lewis, Julia Herzen, and Pierre Thibault "Extending the field-of-view of speckle-based microtomography with the UMPA model", Proc. SPIE 13152, Developments in X-Ray Tomography XV, 131520X (18 October 2024); https://doi.org/10.1117/12.3027762
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Biological samples

Tomography

Refraction

Image processing

Signal attenuation

Synchrotrons

Signal processing

Back to Top