Refractive optics metrology using on-axis deflectometry system

Rebecca Su; Heejoo Choi; Daewook Kim

doi:10.1117/12.3027817

30 September 2024 Refractive optics metrology using on-axis deflectometry system

Rebecca Su, Heejoo Choi, Daewook Kim

Proceedings Volume 13134, Optical Manufacturing and Testing 2024; 1313407 (2024) https://doi.org/10.1117/12.3027817
Event: Optical Engineering + Applications, 2024, San Diego, California, United States

Abstract

An on-axis deflectometry method for measurement of refractive optics is proposed and demonstrated. This system measures wavefront error of a refractive unit under test using a camera, monitor and parabolic mirror all aligned on a single axis. In this way light from the monitor reflects from the parabolic mirror into the aperture of the camera. A null configuration is created when there is no test lens under the test setup. The test lens configuration occurs when a lens is inserted between the mirror and the aperture of the camera. The displacement of image locations of spots displayed on the monitor is analyzed to calculate the wavefront error of the test lens. The system concept is described, the system was built and described, and the procedure was explained along with the reported wavefront error in terms of the first 11 Zernike terms. The test lens position tolerance was evaluated to have +/- 0.13 Diopter accuracy test result.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Rebecca Su, Heejoo Choi, and Daewook Kim "Refractive optics metrology using on-axis deflectometry system", Proc. SPIE 13134, Optical Manufacturing and Testing 2024, 1313407 (30 September 2024); https://doi.org/10.1117/12.3027817

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