CMOS image sensors for x-ray interferometry

T. W. Buggey; M. W. J. Hubbard; K. Stefanov; A. D. Holland; D. J. Hall

doi:10.1117/12.3018322

27 August 2024 CMOS image sensors for x-ray interferometry

T. W. Buggey, M. W. J. Hubbard, K. Stefanov, A. D. Holland, D. J. Hall

Proceedings Volume 13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI; 131030A (2024) https://doi.org/10.1117/12.3018322
Event: SPIE Astronomical Telescopes + Instrumentation, 2024, Yokohama, Japan

Abstract

X-ray interferometry (XRI) was first demonstrated in the early 2000’s, and many early mission concepts followed which exploited the significant improvement in spatial resolution that XRI offered. Unfortunately, optical technology was not mature enough to meet the requirements, and the idea remained dormant. ESA’s voyage 2050 programme, in combination with optical and pointing accuracy technology developments, has reignited interest in the concept, but large technological challenges still remain to realise such a groundbreaking telescope. Given the spectral and now spatial requirements of a XRI, the next generation of detector technologies must be developed which can meet those requirements to enable such a telescope. For the proposed ESA THESEUS x-ray astronomy mission, strict requirements on instrument operating temperature (-40°C) have necessitated developments of new detectors technologies, namely CMOS image sensors (CIS). The CEI, in collaboration with Te2v, have designed, manufactured, and characterised a monolithic fully depleted CIS specifically optimised for soft x-ray astronomy. The prototype detector currently meets the THESEUS soft x-ray imager requirements and boasts a near Fano-limited energy resolution of 130eV (@5.9keV) at -40°C. Although the new technology can perform well, the specific detector requirements of XRI need to balance opposing parameters of spatial and energy resolution. This paper will outline the current performance of the CIS221-X for soft x-ray astronomy (as well as other competing technologies) and describe future plans for developing CIS to meet the challenging requirements of XRI.

Conference Presentation

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

T. W. Buggey, M. W. J. Hubbard, K. Stefanov, A. D. Holland, and D. J. Hall "CMOS image sensors for x-ray interferometry", Proc. SPIE 13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, 131030A (27 August 2024); https://doi.org/10.1117/12.3018322

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available