Presentation
22 August 2024 The X-IFU focal plane assembly development model: microvibrations characterization
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Abstract
This paper describes the micro-vibrational characterization of the Development Model (DM) of the X ray Integral Field Unit Focal Plane Assembly (X-IFU FPA) for the Athena X-ray observatory. We discuss the power dissipation occurring when FPA modes are excited. We compare amplitude and phase measured by X-Z accelerometers, thermometers response and the pixels DC baseline signal due to acceleration provided by actuator towards the FPA center of mass. Impact of the micro-vibrations on the thermal stability at the detectors level and the possible degradation on the pixels performance will be discussed in detail.
Conference Presentation
© (2024) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Emanuele Taralli, Roland den Hartog, Geert Keizer, Johannes Dercksen, Brian Jackson, Henk van Weers, Jan-Willem den Herder, Pourya Khosropanah, Peter Roelfsema, and Damian Audley "The X-IFU focal plane assembly development model: microvibrations characterization", Proc. SPIE 13093, Space Telescopes and Instrumentation 2024: Ultraviolet to Gamma Ray, 130930Z (22 August 2024); https://doi.org/10.1117/12.3018372
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