Non-destructive thickness measurement of the individual layers of end-of-life photovoltaic modules to enable optimized layer separation

Martin De Biasio; Anika Gassner; Gabriele C. Eder; Lukas Neumaier

doi:10.1117/12.3011131

7 June 2024 Non-destructive thickness measurement of the individual layers of end-of-life photovoltaic modules to enable optimized layer separation

Martin De Biasio, Anika Gassner, Gabriele C. Eder, Lukas Neumaier

Author Affiliations +

Proceedings Volume 13026, Next-Generation Spectroscopic Technologies XVI; 130260K (2024) https://doi.org/10.1117/12.3011131
Event: SPIE Defense + Commercial Sensing, 2024, National Harbor, Maryland, United States

Conference Poster

Abstract

The amount of end-of-life photovoltaic modules will increase significantly in the upcoming years. In order to enable a high-quality recycling process, innovative approaches to separate the module laminates layer by layer are required. In this work we use a combination of near-infrared spectroscopy (NIRS) and optical coherence tomography (OCT) to characterize the identity and dimensions of the individual layers within the multi-material composite of a PV module, especially the backsheet. NIRS is used to identify the polymer material types, while OCT measures the respective thickness of the layer. First results show that the combination of both techniques enables a precise qualitative and quantitative description of the layers of a PV module that can be used as an input for subsequent separation and recycling processes.

(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.

Citation Download Citation

Martin De Biasio, Anika Gassner, Gabriele C. Eder, and Lukas Neumaier "Non-destructive thickness measurement of the individual layers of end-of-life photovoltaic modules to enable optimized layer separation", Proc. SPIE 13026, Next-Generation Spectroscopic Technologies XVI, 130260K (7 June 2024); https://doi.org/10.1117/12.3011131

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available