Line-scan, fiber-based surface characterization and temperature monitoring for laser material processing

Yujie Yang; Thomas Weyrauch

doi:10.1117/12.2679497

5 October 2023 Line-scan, fiber-based surface characterization and temperature monitoring for laser material processing

Yujie Yang, Thomas Weyrauch

Proceedings Volume 12672, Applied Optical Metrology V; 126720A (2023) https://doi.org/10.1117/12.2679497
Event: SPIE Optical Engineering + Applications, 2023, San Diego, California, United States

Abstract

The systems employ line-scan fiber-based surface characterization and temperature monitoring based on the two-color pyrometer through the fibers for different wavelength radiation. The proposed system offers a promising approach for SLM process monitoring, providing valuable information for process monitoring and control, leading to improved part quality. The integration of surface characterization and temperature measurement into one system can be used to optimize process parameters, reduce manufacturing costs, and enhance SLM process understanding.

Conference Presentation

Citation Download Citation

Yujie Yang and Thomas Weyrauch "Line-scan, fiber-based surface characterization and temperature monitoring for laser material processing", Proc. SPIE 12672, Applied Optical Metrology V, 126720A (5 October 2023); https://doi.org/10.1117/12.2679497

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