Secondary ion mass spectrometry study of organic and inorganic interfaces in methylammonium lead triiodide solar cells

Beatriz Montaño; Jose Juan Diaz; Yuriy Kudriavtsev; Ismael Cosme; Svetlana Mansurova

doi:10.1117/12.2676764

1 October 2023 Secondary ion mass spectrometry study of organic and inorganic interfaces in methylammonium lead triiodide solar cells

Beatriz Montaño, Jose Juan Diaz, Yuriy Kudriavtsev, Ismael Cosme, Svetlana Mansurova

Author Affiliations +

Proceedings Volume 12660, Organic, Hybrid, and Perovskite Photovoltaics XXIV; 1266008 (2023) https://doi.org/10.1117/12.2676764
Event: SPIE Organic Photonics + Electronics, 2023, San Diego, California, United States

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Abstract

The study of unstable interfaces in perovskite semiconductors requires crucial information on interfacial composition, chemical gradients, and impurity distribution. A versatile technique called TOF-SIMS can provide this information effectively. Solar cells employing methylammonium lead triiodide as the photoactive layer were fabricated, utilizing PEDOT:PSS or NiOx thin film as the hole transporting layer, and PCBM plus ZnO as the electron transporting layer. These inorganic and organic layers were deposited through magnetron sputtering and solution processing, respectively. To comprehensively examine each interface within the device structure, a detailed TOF-SIMS study was conducted.

(2023) Published by SPIE. Downloading of the abstract is permitted for personal use only.

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Beatriz Montaño, Jose Juan Diaz, Yuriy Kudriavtsev, Ismael Cosme, and Svetlana Mansurova "Secondary ion mass spectrometry study of organic and inorganic interfaces in methylammonium lead triiodide solar cells", Proc. SPIE 12660, Organic, Hybrid, and Perovskite Photovoltaics XXIV, 1266008 (1 October 2023); https://doi.org/10.1117/12.2676764

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